Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations

Martina Schmeling, Donald S. Burnett, A. J. G. Jurewicz

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@article{56a6fd6310834d8b960bf312768bd296,

title = "Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations",

author = "Martina Schmeling and Burnett, {Donald S.} and Jurewicz, {A. J. G.}",

note = "Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations",

year = "2011",

month = jan,

day = "1",

language = "American English",

journal = "Default journal",

}

TY - JOUR

T1 - Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations

AU - Schmeling, Martina

AU - Burnett, Donald S.

AU - Jurewicz, A. J. G.

N1 - Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations

PY - 2011/1/1

Y1 - 2011/1/1

UR - http://adsabs.harvard.edu/abs/2011LPI....42.2041S

M3 - Article

JO - Default journal

JF - Default journal

ER -