Steps toward accurate large-area analyses of Genesis solar wind samples: evaluation of surface cleaning methods using total reflection X-ray fluorescence spectrometry

Martina Schmeling; Donald S. Burnett; Amy J. G. Jurewicz; Igor V. Veryovkin

doi:10.1017/S0885715612000346

Steps toward accurate large-area analyses of Genesis solar wind samples: evaluation of surface cleaning methods using total reflection X-ray fluorescence spectrometry

Martina Schmeling, Donald S. Burnett, Amy J. G. Jurewicz, Igor V. Veryovkin

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Powder Diffraction
Volume	27
Issue number	2
DOIs	https://doi.org/10.1017/S0885715612000346
State	Published - Jun 1 2012

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Analytical Chemistry

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10.1017/S0885715612000346License: Unspecified

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title = "Steps toward accurate large-area analyses of Genesis solar wind samples: evaluation of surface cleaning methods using total reflection X-ray fluorescence spectrometry",

author = "Martina Schmeling and Burnett, {Donald S.} and Jurewicz, {Amy J. G.} and Veryovkin, {Igor V.}",

note = "Steps toward accurate large-area analyses of Genesis solar wind samples: evaluation of surface cleaning methods using total reflection X-ray fluorescence spectrometry - Volume 27 Issue 2 - Martina Schmeling, Donald S. Burnett, Amy J. G. Jurewicz, Igor V. Veryovkin",

year = "2012",

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language = "American English",

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journal = "Powder Diffraction",

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AU - Schmeling, Martina

AU - Burnett, Donald S.

AU - Jurewicz, Amy J. G.

AU - Veryovkin, Igor V.

N1 - Steps toward accurate large-area analyses of Genesis solar wind samples: evaluation of surface cleaning methods using total reflection X-ray fluorescence spectrometry - Volume 27 Issue 2 - Martina Schmeling, Donald S. Burnett, Amy J. G. Jurewicz, Igor V. Veryovkin

PY - 2012/6/1

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DO - 10.1017/S0885715612000346

M3 - Article

VL - 27

JO - Powder Diffraction

JF - Powder Diffraction

IS - 2

ER -

Steps toward accurate large-area analyses of Genesis solar wind samples: evaluation of surface cleaning methods using total reflection X-ray fluorescence spectrometry

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