Reusing Deep Learning Models: Challenges and Directions in Software Engineering

James C. Davis; Purvish Jajal; Wenxin Jiang; Taylor R. Schorlemmer; Nicholas Synovic; George K. Thiruvathukal

doi:10.1109/JVA60410.2023.00015

Reusing Deep Learning Models: Challenges and Directions in Software Engineering

James C. Davis
, Purvish Jajal
, Wenxin Jiang
, Taylor R. Schorlemmer
, Nicholas Synovic
, George K. Thiruvathukal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023
Editors	Shaukat Ali, Claudio A. Ardagna, Nimanthi Atukorala, Johanna Barzen, Carl K. Chang, Rong N. Chang, Jing Fan, Ismael Faro, Sebastian Feld, Geoffrey C. Fox, Zhi Jin, Frank Leymann, Florian Neukart, Salvador de la Puente, Manuel Wimmer
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	17-30
Number of pages	14
ISBN (Electronic)	9798350328899
DOIs	https://doi.org/10.1109/JVA60410.2023.00015
State	Published - 2023
Event	2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023 - Hybrid, Chicago, United States Duration: Jul 2 2023 → Jul 8 2023

Publication series

Name	Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023

Conference

Conference	2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023
Country/Territory	United States
City	Hybrid, Chicago
Period	7/2/23 → 7/8/23

ASJC Scopus Subject Areas

Computer Science (miscellaneous)
Artificial Intelligence
Computer Science Applications
Software
Health Informatics

Keywords

Deep learning
Empirical software engineering
Machine learning
Position
Pre-Trained models
Re-use
Vision

Access to Document

10.1109/JVA60410.2023.00015

Cite this

Davis, J. C., Jajal, P., Jiang, W., Schorlemmer, T. R., Synovic, N., & Thiruvathukal, G. K. (2023). Reusing Deep Learning Models: Challenges and Directions in Software Engineering. In S. Ali, C. A. Ardagna, N. Atukorala, J. Barzen, C. K. Chang, R. N. Chang, J. Fan, I. Faro, S. Feld, G. C. Fox, Z. Jin, F. Leymann, F. Neukart, S. de la Puente, & M. Wimmer (Eds.), Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023 (pp. 17-30). (Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/JVA60410.2023.00015

Reusing Deep Learning Models: Challenges and Directions in Software Engineering. / Davis, James C.; Jajal, Purvish; Jiang, Wenxin et al.
Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023. ed. / Shaukat Ali; Claudio A. Ardagna; Nimanthi Atukorala; Johanna Barzen; Carl K. Chang; Rong N. Chang; Jing Fan; Ismael Faro; Sebastian Feld; Geoffrey C. Fox; Zhi Jin; Frank Leymann; Florian Neukart; Salvador de la Puente; Manuel Wimmer. Institute of Electrical and Electronics Engineers Inc., 2023. p. 17-30 (Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Davis, JC, Jajal, P, Jiang, W, Schorlemmer, TR, Synovic, N & Thiruvathukal, GK 2023, Reusing Deep Learning Models: Challenges and Directions in Software Engineering. in S Ali, CA Ardagna, N Atukorala, J Barzen, CK Chang, RN Chang, J Fan, I Faro, S Feld, GC Fox, Z Jin, F Leymann, F Neukart, S de la Puente & M Wimmer (eds), Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023. Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023, Institute of Electrical and Electronics Engineers Inc., pp. 17-30, 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023, Hybrid, Chicago, United States, 7/2/23. https://doi.org/10.1109/JVA60410.2023.00015

Davis JC, Jajal P, Jiang W, Schorlemmer TR, Synovic N, Thiruvathukal GK. Reusing Deep Learning Models: Challenges and Directions in Software Engineering. In Ali S, Ardagna CA, Atukorala N, Barzen J, Chang CK, Chang RN, Fan J, Faro I, Feld S, Fox GC, Jin Z, Leymann F, Neukart F, de la Puente S, Wimmer M, editors, Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023. Institute of Electrical and Electronics Engineers Inc. 2023. p. 17-30. (Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023). doi: 10.1109/JVA60410.2023.00015

Davis, James C. ; Jajal, Purvish ; Jiang, Wenxin et al. / Reusing Deep Learning Models : Challenges and Directions in Software Engineering. Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023. editor / Shaukat Ali ; Claudio A. Ardagna ; Nimanthi Atukorala ; Johanna Barzen ; Carl K. Chang ; Rong N. Chang ; Jing Fan ; Ismael Faro ; Sebastian Feld ; Geoffrey C. Fox ; Zhi Jin ; Frank Leymann ; Florian Neukart ; Salvador de la Puente ; Manuel Wimmer. Institute of Electrical and Electronics Engineers Inc., 2023. pp. 17-30 (Proceedings - 2023 IEEE John Vincent Atanasoff Symposium on Modern Computing, JVA 2023).

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AU - Synovic, Nicholas

AU - Thiruvathukal, George K.

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A2 - Ardagna, Claudio A.

A2 - Atukorala, Nimanthi

A2 - Barzen, Johanna

A2 - Chang, Carl K.

A2 - Chang, Rong N.

A2 - Fan, Jing

A2 - Faro, Ismael

A2 - Feld, Sebastian

A2 - Fox, Geoffrey C.

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PB - Institute of Electrical and Electronics Engineers Inc.

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ER -

Reusing Deep Learning Models: Challenges and Directions in Software Engineering

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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