Low-Quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners

Gaétan de Rassenfosse; William E Griffiths; Adam B Jaffe; Elizabeth Webster

doi:10.1093/JLEO/EWAA026

Low-Quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners

Gaétan de Rassenfosse, William E Griffiths, Adam B Jaffe, Elizabeth Webster

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Journal of Law Economics & Organization
DOIs	https://doi.org/10.1093/JLEO/EWAA026
State	Published - Dec 14 2020

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Business
Optometry

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title = "Low-Quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners",

author = "{de Rassenfosse}, Ga{\'e}tan and Griffiths, {William E} and Jaffe, {Adam B} and Elizabeth Webster",

note = "Abstract. A low-quality patent system threatens to slow the pace of technological progress. Concerns about low patent quality are supported by estimates from li",

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AU - Griffiths, William E

AU - Jaffe, Adam B

AU - Webster, Elizabeth

N1 - Abstract. A low-quality patent system threatens to slow the pace of technological progress. Concerns about low patent quality are supported by estimates from li

PY - 2020/12/14

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M3 - Article

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JF - Journal of Law Economics & Organization

ER -

Low-Quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners

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