Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Y. Choi; P. Eng; J. Stubbs; S.R. Sutton; M. Schmeling; I.V. Veryovkin; D. Burnett

doi:10.1016/j.chemgeo.2016.08.025

Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Y. Choi, P. Eng, J. Stubbs, S.R. Sutton, M. Schmeling, I.V. Veryovkin, D. Burnett

Department of Chemistry and Biochemistry

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Chemical Geology
Volume	441
DOIs	https://doi.org/10.1016/j.chemgeo.2016.08.025
State	Published - Nov 1 2016

Disciplines

Analytical Chemistry
Geology

Access to Document

10.1016/j.chemgeo.2016.08.025License: Unspecified

Cite this

@article{f8b2135d59cf4695917880f4ccfb67a4,

title = "Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing",

author = "Y. Choi and P. Eng and J. Stubbs and S.R. Sutton and M. Schmeling and I.V. Veryovkin and D. Burnett",

note = "X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS...",

year = "2016",

month = nov,

day = "1",

doi = "10.1016/j.chemgeo.2016.08.025",

language = "American English",

volume = "441",

journal = "Chemical Geology",

}

TY - JOUR

T1 - Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

AU - Choi, Y.

AU - Eng, P.

AU - Stubbs, J.

AU - Sutton, S.R.

AU - Schmeling, M.

AU - Veryovkin, I.V.

AU - Burnett, D.

N1 - X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS...

PY - 2016/11/1

Y1 - 2016/11/1

UR - https://www.sciencedirect.com/science/article/pii/S0009254116304028

U2 - 10.1016/j.chemgeo.2016.08.025

DO - 10.1016/j.chemgeo.2016.08.025

M3 - Article

VL - 441

JO - Chemical Geology

JF - Chemical Geology

ER -

Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Disciplines

Access to Document

Other files and links

Cite this