Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Y. Choi; P. Eng; J. Stubbs; S.R. Sutton; M. Schmeling; I.V. Veryovkin; D. Burnett

doi:10.1016/j.chemgeo.2016.08.025

Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Y. Choi
, P. Eng
, J. Stubbs
, S.R. Sutton
, M. Schmeling
, I.V. Veryovkin
, D. Burnett

Department of Chemistry and Biochemistry

Argonne National Laboratory
University of Chicago
University of Illinois at Chicago
California Institute of Technology

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Chemical Geology
Volume	441
DOIs	https://doi.org/10.1016/j.chemgeo.2016.08.025
State	Published - Nov 1 2016

Disciplines

Analytical Chemistry
Geology

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10.1016/j.chemgeo.2016.08.025License: Unspecified

Cite this

@article{f8b2135d59cf4695917880f4ccfb67a4,

title = "Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing",

author = "Y. Choi and P. Eng and J. Stubbs and S.R. Sutton and M. Schmeling and I.V. Veryovkin and D. Burnett",

note = "X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS...",

year = "2016",

month = nov,

day = "1",

doi = "10.1016/j.chemgeo.2016.08.025",

language = "American English",

volume = "441",

journal = "Chemical Geology",

}

TY - JOUR

T1 - Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

AU - Choi, Y.

AU - Eng, P.

AU - Stubbs, J.

AU - Sutton, S.R.

AU - Schmeling, M.

AU - Veryovkin, I.V.

AU - Burnett, D.

N1 - X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS...

PY - 2016/11/1

Y1 - 2016/11/1

UR - https://www.sciencedirect.com/science/article/pii/S0009254116304028

U2 - 10.1016/j.chemgeo.2016.08.025

DO - 10.1016/j.chemgeo.2016.08.025

M3 - Article

VL - 441

JO - Chemical Geology

JF - Chemical Geology

ER -

Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

Disciplines

Access to Document

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