Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques By H. R. Verma (Punjabi University, Patiala, India). Springer: Berlin, Heidelberg, New York. 2007. xiv + 376 pp. $169.00. ISBN 978-3-540-30277-3.

Martina Schmeling

doi:10.1021/ja076996w

Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques By H. R. Verma (Punjabi University, Patiala, India). Springer: Berlin, Heidelberg, New York. 2007. xiv + 376 pp. $169.00. ISBN 978-3-540-30277-3.

Research output: Contribution to journal › Article › peer-review

Original language	American English
Journal	Journal of the American Chemical Society
Volume	129
Issue number	46
DOIs	https://doi.org/10.1021/ja076996w
State	Published - Nov 1 2007

Disciplines

Inorganic Chemistry
Engineering Physics
Nuclear

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10.1021/ja076996wLicense: Unspecified

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Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques By H. R. Verma (Punjabi University, Patiala, India). Springer: Berlin, Heidelberg, New York. 2007. xiv + 376 pp. $169.00. ISBN 978-3-540-30277-3. / Schmeling, Martina.
In: Journal of the American Chemical Society, Vol. 129, No. 46, 01.11.2007.

Research output: Contribution to journal › Article › peer-review

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Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques By H. R. Verma (Punjabi University, Patiala, India). Springer: Berlin, Heidelberg, New York. 2007. xiv + 376 pp. $169.00. ISBN 978-3-540-30277-3.

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