Abstract
Genesis sample 60234 was characterized by laboratory TXRF and synchrotron GI-XRF. Surface contaminants were identified as well as elements within the bulk.
| Original language | American English |
|---|---|
| Journal | Chemistry: Faculty Publications and Other Works |
| Volume | 45 |
| State | Published - Jan 1 2014 |
Keywords
- genesis sample
- x-ray
- fluorescence
- spectometry
Disciplines
- Chemistry
- Analytical Chemistry