Abstract
Genesis sample 60234 was characterized by laboratory TXRF and synchrotron GI-XRF. Surface contaminants were identified as well as elements within the bulk.
Original language | American English |
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Journal | Chemistry: Faculty Publications and Other Works |
Volume | 45 |
State | Published - Jan 1 2014 |
Keywords
- genesis sample
- x-ray
- fluorescence
- spectometry
Disciplines
- Chemistry
- Analytical Chemistry