Analysis of Genesis Sample 60234 by Laboratory Total Reflection X-ray Fluorescence Spectrometry and Synchrotron Grazing Incidence X-ray Fluorescence

Martina Schmeling, E. Hwang, Y. Choi, P.J. Eng, J.E. Stubbs, I.V. Veryovkin

Research output: Contribution to journalArticlepeer-review

Abstract

Genesis sample 60234 was characterized by laboratory TXRF and synchrotron GI-XRF. Surface contaminants were identified as well as elements within the bulk.

Original languageAmerican English
JournalChemistry: Faculty Publications and Other Works
Volume45
StatePublished - Jan 1 2014

Keywords

  • genesis sample
  • x-ray
  • fluorescence
  • spectometry

Disciplines

  • Chemistry
  • Analytical Chemistry

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